CASS Talks with Hussam Amrouch, University of Stuttgart, Germany

Abstract: DNNs largely overwhelm conventional computing systems because the latter is severely bottlenecked by the data movement between processing units and memory. As a result, novel and intelligent computing systems become more and more inevitable. In this talk, I will be focusing on the emerging ferroelectric (FeFET) technology and its great potential in building efficient in-memory computing architectures. I will explain how abstracted reliability models can be developed from device physics to circuits and later employed towards realizing HW/SW codesign for robust in-memory computing. Further, I will also discuss how FeFET-based in-memory computing outstandingly synergizes with Binarized Neural Networks (BNNs) and novel Brain-inspired Hyperdimensional Computing (HDC). Short Bio: Hussam Amrouch is a J.-Professor heading the Chair of Semiconductor Test and Reliability (STAR) within the University of Stuttgart. He received his Ph.D. degree with the highest distinction (summa cum laude) from KIT in 2015. His main research interests are AI processor design, beyond von-Neumann architectures, HW security, and emerging technologies. He holds eight HiPEAC paper awards. He has given 10 tutorials in many major EDA conferences such as DAC and ICCAD and more 25 invited talks in many companies and universities. He is a reviewer in many top journals including Nature Electronics. He has around 160 publications (including 64 journals) in multidisciplinary research areas across the entire computing stack, starting from semiconductor physics to circuit design all the way up to computer architecture. Virtual: https://events.vtools.ieee.org/m/313582